*For representation only.
MC33GD3100B3EK
| Mfr. No: | MC33GD3100B3EK |
| Mfr.: | NXP Semiconductors |
| Category: | Galvanically Isolated Gate Drivers |
| Description: | Galvanically Isolated Gate Drivers IGBT & SiC GDIC for xEV traction inverters |
| Datasheet: | MC33GD3100B3EK Datasheet (PDF) |
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Specifications
| Driven Configuration | Half-Bridge |
| Channel Type | Single |
| Number of Drivers | 1 |
| Gate Type | IGBT, MOSFET (N-Channel) |
| Voltage - Supply | 3.3V |
| Logic Voltage - VIL, VIH | - |
| Current - Peak Output (Source, Sink) | 15A, 15A |
| Input Type | - |
| Rise / Fall Time (Typ) | - |
| Operating Temperature | -40°C ~ 125°C (TA) |
| Grade | Automotive |
| Qualification | AEC-Q100 |
| Mounting Type | Surface Mount |
| Package / Case | 32-BSSOP (0.295", 7.50mm Width) |
| Supplier Device Package | 32-SOIC |
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Product Attributes
| Packaging | Tube |
| Standard Pack Qty | 42 |
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Alternate / Replacement Parts
| Alternate Packaging | MC33GD3100B3EKR2 |
| Suggested Replacement |
3,799
Units In Stock
📦 Tube
- 24-hour response
- Global shipping
- Genuine parts guaranteed
Test report available upon request —
view sample report
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Key Specifications
| Category | Galvanically Isolated Gate Drivers |
| RoHS | RoHS Compliant |
| Lifecycle | |
| Lead Time | 112 Days (from factory) |
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Documentation
⬇ Download Datasheet
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Compliance & Export
| Country / Standard | Code |
|---|---|
| CNHTS | 8542399000 |
| CAHTS | 8542390000 |
| USHTS | 8542390090 |
| MXHTS | 8542399999 |
| ECCN | EAR99 |
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Product Overview
NXP Semiconductors's MC33GD3100B3EK is a widely used galvanically isolated gate drivers part in electronic designs. This component is defined by driven configuration: Half-Bridge, channel type: Single, number of drivers: 1, gate type: IGBT, MOSFET (N-Channel), voltage, supply: 3.3V and logic voltage, VIL, VIH: -. This part has a typical lead time of 112 Days from factory and ships with a full manufacturer datasheet available for download. Simplytronix supplies MC33GD3100B3EK with same-day shipping and guaranteed authenticity.
